This is a past event.

Materials Science and Engineering Seminar

Erico Freitas

Research Scientist, Materials Science and Engineering
Michigan Technological University

Electron Crystallography in the TEM: Using CBED to Determine Bravais Lattice, Point and Space Group, Lattice Parameters Refinement

Transmission electron microscopy (TEM) is widely used for morphological, structural and compositional studies of solid phase systems at the nano and atomic scale. During this seminar Dr. Freitas will discuss the use of TEM to perform convergent-beam electron diffraction (CBED) and its application in the field of electron crystallography. He will address the use of symmetry analysis to deduce important information about a crystal structure: crystal system, Bravais lattice, point and space group.

Dr. Freitas manages the FEI 200kV Titan Themis STEM in the Electron Optics  Facility of the Applied Chemical and Morphological Analysis Laboratory (ACMAL)  at Michigan Tech.